AL-DHAHIR, Tarq A.; KHODAIR, Ziad T. Characterization of CdO film AFM and XRD Diffraction Using Rietveld Refinement. Ibn AL-Haitham Journal For Pure and Applied Sciences, Baghdad, Iraq., v. 27, n. 1, p. 83–92, 2017. Disponível em: https://jih.uobaghdad.edu.iq/index.php/j/article/view/364. Acesso em: 14 mar. 2025.