“Characterization of CdO film AFM and XRD Diffraction Using Rietveld Refinement” (2017) Ibn AL-Haitham Journal For Pure and Applied Sciences, 27(1), pp. 83–92. Available at: https://jih.uobaghdad.edu.iq/index.php/j/article/view/364 (Accessed: 28 April 2024).