“Characterization of CdO Film AFM and XRD Diffraction Using Rietveld Refinement”. Ibn AL-Haitham Journal For Pure and Applied Sciences 27, no. 1 (April 19, 2017): 83–92. Accessed April 28, 2024. https://jih.uobaghdad.edu.iq/index.php/j/article/view/364.