Al-Dhahir TA, Khodair ZT. Characterization of CdO film AFM and XRD Diffraction Using Rietveld Refinement. IHJPAS [Internet]. 2017 Apr. 19 [cited 2025 Mar. 14];27(1):83-92. Available from: https://jih.uobaghdad.edu.iq/index.php/j/article/view/364