A study of Some Electrical Properties of Te:S Thin Films Deposited at Angle Ó¨=70o

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Farah J. Khadum
Hanaa S. Sabaa

Abstract

       In this research a study of some electrical properties Of (Te) thin films with(S) impurities of(1.2%) were deposited at( Ó¨=700)by thermal evaporation technique .The  thicknesses of deposited films were (1050 , 1225 , 1400 , 1575  nm) on a glass substrates of different dimensions . From X-ray diffraction spectrum, the films are polycrystalline .A study of (I-V) characteristic for thin films, the measurements of electrical conductivity (σ)and electrical resistance(R )vs. temperature( T) are done. Further a measurement of thermoelectric power, see beck coefficient and activation energies ( Ea, Es) were computed

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How to Cite
Khadum, F. J., & Sabaa, H. S. (2017). A study of Some Electrical Properties of Te:S Thin Films Deposited at Angle Ó¨=70o. Ibn AL- Haitham Journal For Pure and Applied Sciences, 27(1), 121–128. Retrieved from https://jih.uobaghdad.edu.iq/index.php/j/article/view/369
Section
physics