Effect of Annealing Temperature on the Structural and Optical Properties of The CdO Thin Films Prepared By Vacuum Evaporation Thermal Technique
Keywords:
CdO thin films, X-ray diffraction, Structural, Optical proper ties, Absorbance, BandgapAbstract
Cadmium Oxide films have been prepared by vacuum evaporation technique on a glass substrate at room temperature. Structural and optical properties of the films are studied at different annealing temperatures (375 and 475) ËšC, for the thickness (450) nm at one hour. The crystal structure of the samples was studied by X- ray diffraction. The highest value of the absorbance is equal to (78%) in the wavelength (530) nm, at annealing temperature (375) ËšC. The value of at a rate of deposition is (10) nm/s. The value of optical energy gap found is equal to (2.22) eV.